NDA500 XRF spectrometer for testing without disassembly
A 0.5 mm minimum spot, 16 composite filters and automatic Mapping for complex sample screening.
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Instruments
Explore the NDA and NaU instrument families. Choose a configuration around your target elements, sample form and analytical task.
NDA200 without disassembly
NDA200 without disassembly: original product image and published application information.
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NDA300 without disassembly
NDA300 without disassembly: original product image and published application information.
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NDA300 alloy analysis
NDA300 alloy analysis: original product image and published application information.
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NDA200 alloy analysis
NDA200 alloy analysis: original product image and published application information.
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NDA500 alloy analysis
NDA500 alloy analysis: original product image and published application information.
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NaU-E610 integrated system
NaU-E610 integrated system: original product image and published application information.
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NaU-E600 general-purpose model
NaU-E600 general-purpose model: original product image and published application information.
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NDA500 Mapping coating thickness
NDA500 Mapping coating thickness: original product image and published application information.
Explore instrumentNDA200 coating thickness
NDA200 coating thickness: original product image and published application information.
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Product catalogue
NDA and NaU instruments for screening, alloys, coatings and research projects.
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